Add to ORKGThis dataset includes the original data of the BSE simulation presented in the figures in the paper manuscript. The files are named after the material and the applied primary energy/deceleration voltage.<br
The use of lower energy (0.5 to 10 keV) electron beams in the scanning electron microscope (LVSEM) p...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Inclusion backscattered electron images generated from SEM analysis, compiled from 4 final product s...
Recently developed detectors can deliver high resolution and high contrast images of nanostructured ...
Recently developed detectors can deliver high resolution and high contrast images of nanostructured ...
AbstractRecently developed detectors can deliver high resolution and high contrast images of nanostr...
Due to the influence of refraction effects on the escape probability of the Back-Scattered Electrons...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...
This file contains: Simulated line scans of the backscattered electron signals obtained from Monte ...
Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electro...
The effect of the electron beam skirting on the emission and detection of the backscattered electron...
Electron detectors used for imaging in the scanning electron microscope include those which detect s...
Raw data (electron microscopy images and spectra) obtained for work on aberration-corrected transmis...
Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for ma...
Serial block-face scanning electron microscopy (SBEM) is quickly becoming an important imaging tool ...
The use of lower energy (0.5 to 10 keV) electron beams in the scanning electron microscope (LVSEM) p...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Inclusion backscattered electron images generated from SEM analysis, compiled from 4 final product s...
Recently developed detectors can deliver high resolution and high contrast images of nanostructured ...
Recently developed detectors can deliver high resolution and high contrast images of nanostructured ...
AbstractRecently developed detectors can deliver high resolution and high contrast images of nanostr...
Due to the influence of refraction effects on the escape probability of the Back-Scattered Electrons...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...
This file contains: Simulated line scans of the backscattered electron signals obtained from Monte ...
Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electro...
The effect of the electron beam skirting on the emission and detection of the backscattered electron...
Electron detectors used for imaging in the scanning electron microscope include those which detect s...
Raw data (electron microscopy images and spectra) obtained for work on aberration-corrected transmis...
Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for ma...
Serial block-face scanning electron microscopy (SBEM) is quickly becoming an important imaging tool ...
The use of lower energy (0.5 to 10 keV) electron beams in the scanning electron microscope (LVSEM) p...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Inclusion backscattered electron images generated from SEM analysis, compiled from 4 final product s...